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Webinar
Analysis of Traces in Precious Metals Utilizing the Innovative DSOI ICP-OES
Description
The monetary value of
precious metals
directly correlates with their purity level. In this webcast, we present a novel
ICP-OES
technique, DSOI plasma observation, for analyzing trace amounts of impurities in precious metals.
It is crucial to determine this purity level with absolute accuracy, especially when trading precious metal products. The difference method is used to determine purities above 99%. Impurities are identified and purity levels are calculated by subtracting all impurities from 1000 ‰.
Inductively coupled plasma optical emission spectrometry (ICP-OES) is a highly effective method for analyzing impurities in precious metals. Its ability to analyze multiple elements, its wide linear dynamic range, and its high sensitivity make it the preferred analytical technique. It is also described in various ISO standards and ASTM methods.
The
SPECTRO ARCOS MultiView
is the ideal ICP-OES instrument for this application due to its advanced design and performance capabilities. A key feature of the SPECTRO ARCOS is its direct light path DSOI technique and simultaneous full spectrum capture, including the VUV range. This feature provides the highest precision and sensitivity.
The webcast discusses the instrument technology and measurement methodology, and presents figures of merit for the analysis of trace elements in precious metals.
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Analysis of Traces in Precious Metals Utilizing the Innovative DSOI ICP-OES
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