Webinar

Enhancing Elemental Analysis in the Chemical Industry: Unleashing the Potential of ED-XRF

Description

In the realm of modern elemental analysis, ICP-OES and ICP-MS are indispensable tools widely employed in chemical industry laboratories. However, ED-XRF technology is gaining traction, particularly for applications where traditional methods fall short. Here's why:

1) Challenging Sample Digestion: Some samples are notoriously difficult to digest, or the process takes too long for routine analysis. Take, for instance, analyzing silicon content in talc or polyamide powder.

2) Complex Elemental Composition: Certain elements pose challenges for easy analysis at required levels, such as halogens like chlorine, bromine, or iodine. From screening fluorine content in various samples to detecting low levels of chlorine in solvents, or even analyzing iodine content in food/feed, these are just a few examples.

3) Preventing Cross Contamination: There's a need to screen samples for composition without risking cross contamination. For instance, analyzing elements requiring lengthy wash-out times when present at elevated concentrations.

Join us for an enlightening webinar where we delve into how the SPECTRO XEPOS addresses these challenges head-on. Whether you're a seasoned researcher, scientist, or enthusiastic analyzer, this webinar promises to revolutionize your understanding of elemental analysis capabilities. Don't miss your chance to explore the future of elemental analysis with us.

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