Elemental analysis is a must for all stages of the mining cycle, from exploration to production to reclamation. As easy-to-find, high-grade deposits have been discovered and worked, more and more lower-grade deposits are being developed, where volume and ease of surface mining compensate for the lower grade. Direct discovery of deposits from surface outcrops is rare.
So, today’s analytical techniques must search for deposits under cover by detecting their “halo” and “footprint through cover” signals. This requires the sampling of larger areas; usually a multi-element assay; and the ability to detect weak signatures via capabilities such as high sensitivity or low detection limits.
This white paper examines the use of state-of-the-art ICP-OES and ED-XRF analyzers for these challenging applications.
Learn more in this informative white paper.
