Ihr Browser ist veraltet. Diese Website ist optimiert für den Internet Explorer 9 (ohne Kompatibilitätsmodus) und höher, Chrome 29, Firefox 23 und Safari 6.0. Sollten Sie Ihren Browser nicht aktualisieren können, kontaktieren Sie uns bitte
hier
.
Skip to content
Application Brief
ICP-OES: Elemental Analysis of Trace Elements in Concentrated Hydrofluoric Acid Using a Desolvating Pneumatic Nebulizer (ESI-Apex HF)
Concentrated hydrofluoric acid plays a crucial role in industries like petrochemical refining, semiconductor manufacturing, and the production of lithium-ion batteries. Its ability to dissolve silicon oxide is foundational for etching and cleaning applications in high-tech processes. The challenge of maintaining ultra-pure standards for concentrated hydrofluoric acid requires sophisticated analytical methods capable of detecting trace elements at extremely low levels. This ICP-OES report explores the methodologies employed to meet these stringent purity demands, offering insights into the role of cutting-edge elemental analysis in ensuring process integrity.
The document highlights the precision achieved through advanced ICP-OES techniques, detailing the detection of impurities at parts-per-billion concentrations. It emphasizes the importance of reliable calibration standards and operational efficiency in controlling contamination levels in concentrated hydrofluoric acid. These advancements are vital for supporting industries that depend on this critical chemical to drive innovation and achieve optimal performance in their processes.
Learn more in this compelling report.
×
ICP-OES: Elemental Analysis of Trace Elements in Concentrated Hydrofluoric Acid Using a Desolvating Pneumatic Nebulizer (ESI-Apex HF)
MacCMS
×